Normal Waveguide Interface Variations Impact Millimeter Wave Calibration Quality

OML publishes technical paper at the 76th ARFTG Microwave Measurement Symposium.  The title of the paper is, “Understanding the Residual Waveguide Interface Variations on Millimeter Wave Calibration.”  For engineers struggling to interpret the quality of their waveguide calibration, this paper contains valuable data showing the practical results to expect when calibrating with the standard tolerances inherent in today’s waveguide interfaces. Although these waveguide imperfections are within tolerance, they will degrade the quality, but not invalidate, the calibration.  Paper is now available for general distribution.

ARFTG Web Reference:

About OML, Inc.

OML, Inc. (, located in the Silicon Valley of California, is a premier supplier of innovative millimeter and sub-millimeter wave frequency extension products and accessories for vector network analyzers, scalar network analyzers, spectrum analyzers, converters, and signal generators.  Our solutions extend the frequency range of existing microwave instrumentation to address R&D and manufacturing needs in emerging applications spanning radio astronomy, communication, imaging, space research, and homeland security.  We collaborate with engineers throughout the world to develop, “Innovation in Millimeter Wave Measurements.”


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