Characterize Millimeter Wave Amplifiers Using an Innovative Single Connection Approach

OML publishes technical paper at the 78th ARFTG Microwave Measurement Symposium. The title of the paper is, “Characterize Millimeter Wave Amplifiers Using an Innovative Single Connection Approach.”

Abstract -- Similar to amplifiers intended for microwave applications, the emergence of active devices for millimeter wave (mm-wave) applications will require characterization of both S-parameters and gain compression, especially in the on-wafer environment. This paper presents an innovative single connection multiple measurements (SCMM) approach based on a vector network analyzer (VNA) to characterize a W-band (75-110 GHz) amplifier in terms of S-parameters and gain compression. In this approach, the second test channel integrates a new mm-wave electronic variable attenuator to optimize dynamic range and avoid compression artifacts from the high output power of the amplifier.

Paper is now available for general distribution.

ARFTG Web Reference:

OML, Inc. (, located in the Silicon Valley of California, is a premier supplier of innovative millimeter and sub-millimeter wave frequency extension products and accessories for vector network analyzers, scalar network analyzers, spectrum analyzers, converters, and signal generators. Our solutions empower engineers in R&D and manufacturing to pursue opportunities in emerging applications spanning radio astronomy, communication, imaging, space research, biomedical and homeland security. We collaborate with engineers throughout the world to develop, “Innovation in Millimeter Wave Measurements."


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